Charge carrier transport and space charge in thin films of antimony trisulphide

Data on the resistance of thin sputtered zinc films before and after thermal aging suggest the existence of two layers: the lower layer, about 140 Å thick, corresponding to the first critical thickness, is strongly modified by aging, and electronic conduction occurs by reflection at grain boundaries (M-S model); the top layer is slightly modified by aging, and conduction occurs by reflection at grain boundaries and on the top surface. The phenomena are quite consistent with the theory of the nucleation growth of sputtered films.