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Electrical conduction phenomena in thin tetracene films
Authors:A.K Witt  D.C Larson
Affiliation:Department of Physics, Drexel University, Philadelphia, Pa. 19104 U.S.A.
Abstract:Thin film aluminium oxide capacitors using anodic Al2O3 as the dielectric are described. The dependence of oxide thickness and dielectric loss on anodization voltage was studied. Variation of capacitance with temperature and frequency was also investigated. The capacitors were used in conjunction with tantalum resistors to fabricate an astable multivibrator circuit and the waveforms were recorded. The combination of aluminium oxide capacitors and tantalum resistors has some advantages over all-tantalum RC networks.
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