Radio-wave diagnostics of plane layered dielectrics using the inverse problem

We have developed a method for the radio-wave nondestructive testing of exfoliations in a dielectric layer. The method is based on the multifrequency sounding in 5-mm wavelength range and the solution of the inverse problem with determining the thicknesses of separate layers of a dielectric structure. We have also determined experimentally the precision and resolution of this method.