Radio-wave diagnostics of plane layered dielectrics using the inverse problem |
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Authors: | V. R. Dzhala L. I. Kapko |
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Affiliation: | (1) 5260 Renaissance Ave, 92122 San Diego, USA;; |
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Abstract: | We have developed a method for the radio-wave nondestructive testing of exfoliations in a dielectric layer. The method is based on the multifrequency sounding in 5-mm wavelength range and the solution of the inverse problem with determining the thicknesses of separate layers of a dielectric structure. We have also determined experimentally the precision and resolution of this method. |
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