Effect of geometry and dielectric material on thermo-mechanical strain on micro-vias in build-up substrates |
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Authors: | Kimihiro Yamanaka Teruya Fujisaki Manabu Ichinose Takafumi Ooyoshi |
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Affiliation: | (1) Advanced Packaging Laboratory, KYOCERA SLC Technologies Corporation, 656 Ichimiyake Yasu, Shiga 520-2362, Japan |
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Abstract: | Build-up substrates have been preferable solutions for small and high performance systems for more than a few decades. Micro-vias
need to be smaller to realize ever higher wiring density in build-up substrates, but there has been concern on the reliability.
This paper focuses on Cu filled micro-vias of 25 μm in diameter and investigates the strain on micro-vias using a finite element
method for varying geometric parameters and material properties. The strain becomes smaller with shrinking micro-vias, and
a prediction equation for the strain is developed as a function of the aspect ratio and material properties for both single
and stacked micro-vias. |
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