Screening of long-wavelength laser at high temperature and high current levels |
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| Authors: | Higuchi H Oomura E Hirano R Sakakibara Y Namizaki H Susaki W Fujikawa K |
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| Affiliation: | Mitsubishi Electric Corporation, LSI Research & Development Laboratory, Itami, Japan; |
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| Abstract: | It is found that electroluminescent mode aging at high-temperature and high-current levels is useful for selecting long-lived InGaAsP 1.3 ?m lasers. Lasers selected by this screening have little change in threshold current or forward voltage through the aging test at an elevated temperature with constant light-output power. |
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