首页 | 本学科首页   官方微博 | 高级检索  
     


An examination of the applicability of the DNP metric on first level reliability assessments in underfilled electronic packages
Authors:W Dauksher  W S Burton
Affiliation:Agilent Technologies, 4380 Ziegler Road, MS 64, Fort Collins, CO 80525, USA
Abstract:The notion of using the distance from neutral point (DNP)1 as a metric to assess the criticality of first level package thermomechanical stresses is examined in this paper. This metric has been applied by assuming that testing of electronic package assemblies with largest applicable DNP is required to infer the quality of similar packages with smaller die dimensions. Through a review of complex thermomechanical analyses available in the literature together with finite element studies performed herein for representative package geometries, this simple yet commonly applied approach is shown to be an overly conservative methodology for packages with first level underfill. For the representative cases considered, the local edge stresses and strains presumed to cause first level failure are shown to increase with DNP to a point where they no longer increase. A new methodology is presented based on this information for estimating test vehicle configurations needed to confidently qualify similar packages with larger die sizes.
Keywords:
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号