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Characteristic-impedance measurement error on lossy substrates |
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| Authors: | Williams DF Arz U Grabinski H |
| Affiliation: | Nat. Inst. of Stand. & Technol., Boulder, CO ; |
| Abstract: | This paper examines error caused by parasitic inductance in the characteristic impedance measured by the calibration comparison method on lossy silicon substrates |
| Keywords: | |