Structure–property relation in varieties of silk fibers

Crystallite shape ellipsoid in different varieties of silk fibers namely (i) Chinese (ii) Indian, and (iii) Japanese, has been computed using wide‐angle X‐ray data and Hosemann's one‐dimensional paracrystalline model. The estimated microcrystalline parameters are correlated with the observed physical property of the silk fibers. © 2001 John Wiley & Sons, Inc. J Appl Polym Sci 79: 1979–1985, 2001