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潘宁放电溅射沉积纳米级AlN薄膜的性质
引用本文:李慧玉,施芸城,闫永辉,杨平,冯贤平. 潘宁放电溅射沉积纳米级AlN薄膜的性质[J]. 真空, 2006, 43(2): 32-35
作者姓名:李慧玉  施芸城  闫永辉  杨平  冯贤平
作者单位:1. 东华大学,上海,200051
2. 波多黎各大学,圣胡安,00931-3343
基金项目:上海市科委资助项目;重庆市应用基础研究基金;波多黎各大学校科研和教改项目
摘    要:设计并制造了新的潘宁型等离子体源实验装置,分析了等离子体的发射光谱和产生AIN的动力学机理。在室温条件下,纯氮气的工作环境中用潘宁放电离子源溅射的方法,在Si(100)衬底上制备了纳米级的光滑平整AIN薄膜。本文用扫描电镜(SEM),原子力显微镜(ATM),红外吸收光谱(FTIR)和拉曼光谱(Raman shift)等测试分析技术用来研究了薄膜的微结构特征。

关 键 词:潘宁放电  溅射  AlN薄膜
文章编号:1002-0322(2006)02-0032-04
收稿时间:2005-03-18
修稿时间:2005-03-18

Growth and characterization of aluminum nitride films by penning-type discharge plasma sputtering process
LI Hui-yu,SI Yun-cheng,YAN Yong-hui,YANG Ping,FENG Xian-ping. Growth and characterization of aluminum nitride films by penning-type discharge plasma sputtering process[J]. Vacuum(China), 2006, 43(2): 32-35
Authors:LI Hui-yu  SI Yun-cheng  YAN Yong-hui  YANG Ping  FENG Xian-ping
Affiliation:1. Departrntnt of Physics, Dong Hua Untvrsity, Shanghai 200051, China ; 2. Department of Physics University of Puerto Rico, San Juan 00931-3343 ,USA
Abstract:Aluminum nitride films were synthesized on Si(100) substrates at room temterature by penning-type discharge plasma sputtering process.The surface morphology of the films indicated that the AlN films deposited are very smooth and homogeneous.Their microstructures were investigated by Raman spectroscopy and FTIR spectroscopy.
Keywords:penning-type discharge   sputtering    aluminum nitride
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