| 使用DS12887的用电参数智能测试仪 |
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| 引用本文： | 王玉彬,林春英.使用DS12887的用电参数智能测试仪[J].山东电力高等专科学校学报,1998(1). |
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| 作者姓名： | 王玉彬 林春英 |
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| 作者单位： | 山东电力高等专科学校电力系!济南250002 |
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| 摘 要： | 介绍一种新型日历时钟芯片DS12887的性能特点及其在用电参数测试仪中的应用,并对提高该仪器的可靠性进行了较详细的讨论。
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| 关 键 词： | 芯片 参数 可靠性 |
The Application of DS12887 Clock Core Chip in the Power Parameter Meesuring Instrument |
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| Wang Yubin Lin Chunging.The Application of DS12887 Clock Core Chip in the Power Parameter Meesuring Instrument[J].Journal of Shandong College of Electric Power,1998(1). |
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| Authors: | Wang Yubin Lin Chunging |
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| Affiliation: | Department of electrical engineeing |
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| Abstract: | The properties and characterstics of a new tgpe Dsl2887clock core chip are introduced. The application of the Dsl2887 clock core chip is described in this power parameter measuring instrument. Mean while we discuss how to improve the reliability of this instrument. |
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| Keywords: | core chip parameter reliability |
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