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A variance-reduced electrothermal Monte Carlo method for semiconductor device simulation
Authors:Orazio Muscato  Vincenza Di Stefano  Wolfgang Wagner
Affiliation:1. Dipartimento di Matematica e Informatica, Viale Andrea Doria 6 - 95125 Catania, Italy;2. Weierstrass Institute for Applied Analysis and Stochastics, Mohrenstrasse 39 - 10117 Berlin, Germany
Abstract:This paper is concerned with electron transport and heat generation in semiconductor devices. An improved version of the electrothermal Monte Carlo method is presented. This modification has better approximation properties due to reduced statistical fluctuations. The corresponding transport equations are provided and results of numerical experiments are presented.
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