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Determination of the flouride concentration profile in tooth enamel using a nuclear resonance technique
Authors:John W Mandler  Robert B Moler  Elliott Raisen  KS Rajan
Affiliation:IIT Research Institute, 10 West 35th Street, Chicago, Ill. 60616, U.S.A.
Abstract:The 19F (p,αγ) 16O reaction has been used to measure the concentration profile of fluorine in tooth enamel. By observing the characteristic 6.13 MeV gamma ray with a high resolution Ge(Li) detector, the fluorine concentration was measured to a depth of 2.1 μm in teeth treated with K2ZrF6, NaF and acidulated fluorophosphate. The differential depth resolution was better than 0.1 μm at the surface of the teeth. Additional information on the average elemental concentration within the first 2 μm was obtained by observing the characteristic X-ray produced by 1.8 MeV protons. The exploratory data developed in this study have indicated that the highest uptake of fluoride was achieved through the application of K2ZrF6.
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