Group III alkyl source purity effect on the quality of GaAs grown with tertiarybutylarsine |
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Authors: | V S Sundaram L M Fraas C C Samuel |
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Affiliation: | (1) High Technology Center, Boeing Aerospace & Electronics, MS 7J-98, P.O. Box 3999, 98124 Seattle, Washington |
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Abstract: | We have grown unintentionally doped GaAs films using tertiarybutylarsine (tBAs) or arsine reacted with clean or silicon contaminated
triethylgallium. Hall and SIMS data along with photoluminescence spectra show that the silicon contaminant level in GaAs MOCVD
layers grown with tBAs is higher than for layers grown using arsine. Thus, high purity in the triethylgallium source is more
critical for high purity GaAs films when using tBAs than when using arsine. |
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Keywords: | MOCVD GaAs TEG tertiarybutylarsine |
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