| EDXRF法测定V-Ta合金中Ta含量 |
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| 引用本文： | 刘露,余春荣,赵建龙,肖吉群,王雯,高戈. EDXRF法测定V-Ta合金中Ta含量[J]. 核电子学与探测技术, 2016, 0(7): 710-713. DOI: 10.3969/j.issn.0258-0934.2016.07.011 |
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| 作者姓名： | 刘露 余春荣 赵建龙 肖吉群 王雯 高戈 |
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| 作者单位： | 中国工程物理研究院材料研究所,四川江油,621907 |
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| 摘 要： | 为适应新型合金材料(V-Ta合金)研制的需要,建立了用能量色散X射线荧光光谱(EDXRF)法测定V-Ta合金中Ta含量的分析方法。该方法将溶解的V-Ta合金切屑样制成滤纸片试样,用能量色散X射线荧光光谱仪测定其Ta含量。该方法简便、快速,测定Ta含量在25%~40%范围内的样品时,其测量结果的相对标准偏差(n=6)不大于1%。
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| 关 键 词： | V-Ta合金 EDXRF法 Ta含量 |
Determination of Ta Content in V-Ta Alloy by EDXRF |
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| Abstract: | A simple, fast, and accurate analytical method of determining Ta content in V-Ta alloy was estab-lished by adopting Energy-dispersive X-ray fluorescence spectrometric ( EDXRF ) . In the measurements, swarf from V-Ta alloy was dissolved and then absorbed by filter papers. Subsequently, the obtained filter pa-per samples were measured by EDXRF to determine Ta content. The relative standard deviation (n=6) of this analytical method is less than 1%, when the Ta content of test samples ranges from 25% to 40%. |
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| Keywords: | V-Ta alloy energy-dispersive X-ray fluorescence spectrometric tantalum content |
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