| A test device for isotopic γ-ray imaging with CdZnTe detector |
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| 引用本文： | HUANG Jin WANG Xiaolian ZENG Hui XU Zizong. A test device for isotopic γ-ray imaging with CdZnTe detector[J]. 核技术(英文版), 2007, 18(2): 107-110. DOI: 10.1016/S1001-8042(07)60028-1 |
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| 作者姓名： | HUANG Jin WANG Xiaolian ZENG Hui XU Zizong |
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| 作者单位： | [1]Special Class for the Gifted Young, University of Science and Technology of China, Hefei 230026, China [2]Department of Modern Physics, University of Science and Technology of China, Hefei 230026, China |
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| 基金项目： | Supported by National Science Foundation of China （No.10475074） |
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| 摘 要： | A test device for isotopic γ-ray imaging, which consists of an isotope γ-ray source, a CdZnTe γ-ray spectrometer and other auxiliary equipment, is studied here. Compared with the conventional X-ray, the isotope γ-ray, which is utilized in this project, has its own advantages in imaging. Furthermore, with a room-temperature high-energy-resolution CdZnTe detector and a modem imaging processing technique, this device is capable of effectively suppressing the background and gaining more information, thus it can obtain a better image than conventional X-ray devices. In the experiment of PCB imaging, all soldered points and chip components are sharply demonstrated.
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| 关 键 词： | 同位素γ射线源 成像 检测装置 CdZnTe探测器 |
| 收稿时间： | 2006-03-09 |
A test device for isotopic γ-ray imaging with CdZnTe detector |
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| HUANG Jin,WANG Xiaolian,ZENG Hui,XU Zizong,. A test device for isotopic γ-ray imaging with CdZnTe detector[J]. , 2007, 18(2): 107-110. DOI: 10.1016/S1001-8042(07)60028-1 |
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| Authors: | HUANG Jin WANG Xiaolian ZENG Hui XU Zizong |
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| Affiliation: | 1. Special Class for the Gifted Young, University of Science and Technology of China, Hefei 230026, China;2. Department of Modern Physics, University of Science and Technology of China, Hefei 230026, China;1. School of Materials Science and Engineering, Shanghai University, Shanghai 200444, PR China;2. Department of Electrical and Computer Engineering, Rutgers University, Piscataway, NJ 08854, USA |
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| Abstract: | A test device for isotopic γ-ray imaging, which consists of an isotope γ-ray source, a CdZnTe γ-ray spectrometer and other auxiliary equipment, is studied here. Compared with the conventional X-ray, the isotope y-ray, which is utilized in this project, has its own advantages in imaging. Furthermore, with a room-temperature high-energy-resolution CdZnTe detector and a modern imaging processing technique, this device is capable of effectively suppressing the background and gaining more information, thus it can obtain a better image than conventional X-ray devices. In the experiment of PCB imaging, all soldered points and chip components are sharply demonstrated. |
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