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直方图均衡化算法在微光枪瞄检测系统中的应用
引用本文:高有堂,田思,邱亚峰,常本康.直方图均衡化算法在微光枪瞄检测系统中的应用[J].兵工学报,2007,28(10):1205-1208.
作者姓名:高有堂  田思  邱亚峰  常本康
作者单位:南京理工大学,电子工程与光电技术学院,江苏,南京,210094;南阳理工学院,电子与电气工程系,河南,南阳,473004;南京理工大学,电子工程与光电技术学院,江苏,南京,210094
基金项目:河南省教育厅自然科学基金
摘    要:微光枪瞄检测技术一直是军备生产者所关注的问题。由于振动、射击、冲击、跌落和高低温环境等载荷作用下,使微光枪瞄机械、光学结构和电性能参数发生改变,导致微光枪瞄不能正常工作和使用。为了解决上述问题,设计了多环境试验条件下的微光枪瞄检测与测试系统,给出了由CCD组成检测系统工作原理,利用直方图均衡化算法对微光枪瞄图像进行处理,并结合实际工程应用,其测量精度≤0.05 mil,测量范围≥40 mil,满足应用要求。

关 键 词:电子技术  直方图均衡化  微光枪瞄  检测
文章编号:1000-1093(2007)10-1205-04
修稿时间:2006-10-24

Application of Histogram Equalization Algorithm in Low-level-light Weapon Sight Measurement System
GAO You-tang,TIAN Si,QIU Ya-feng,CHANG Ben-kang.Application of Histogram Equalization Algorithm in Low-level-light Weapon Sight Measurement System[J].Acta Armamentarii,2007,28(10):1205-1208.
Authors:GAO You-tang  TIAN Si  QIU Ya-feng  CHANG Ben-kang
Affiliation:1.School of Electronic Engineering and Optoelectronic Technology, Nanjing University of Science and Technology, Nanjing 210094, Jiangsu, China; 2. Department of Electronic and Electrician Engineering, Nanyang Institute of Technology, Nanyang 473004,Henan, China
Abstract:Low-level-light (LLL) weapon sight measurement technologies are always concerned by military equipment manufacturers. The load actions of vibration, shooting, shock, drop, high and low temperature environment, etc. make the machinery, the optical structure and the electric performance parameters of the sight to change with the result that the sight can’t be worked and used normally at taking aim. In order to solve the problems above, the measure and test system of the sight was de?signed under environmental experiment condition, the operation principle of the detection system by CCD was given, the image of the sight was processed by the histogram equalization algorithm. The measure precision which is less than 0.05 mil and the measure range which is greater than 40 mil can meet the requirements of the engineering application.
Keywords:electron technology  histogram equalization  low-level-light weapon sight  measurement
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