Measuring the angular dependent energy distribution of backscattered electrons at variable geometry |
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Authors: | Wagner J Stummer W Völkerer M Hanke A Wernisch J |
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Affiliation: | Graz University of Technology, Institute for Electron Microscopy, Austria. julian.wagner@felmi-zfe.at |
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Abstract: | An aluminium semisphere system with 120 points of entry and eight detection areas, assembled on a meridian covering 0.0026 steradian each, was put over a solid bulk sample (e.g., aluminium), which was mounted in the eucentric point so that the incident electron beam could be varied by a polar rotation of the sphere in steps of 11.25 degrees. The complete angular distribution of the backscattered electrons became available by a rotation in steps of 11.25 degrees azimuthally. For this particular setup, the signals from the detection areas as well as the signal from the rest of the semisphere were amplified by operational amplifiers (Burr-Brown OPA128LM). However the signal of the semisphere was not available at that time. Specimen current measurements made the total amount of electrons accessible, providing a possibility for normalization of the results and comparison with total backscattering coefficients. By use of counter voltage variable up to 10 kV inside the detection assembly, it was possible to measure an energy resolution of the backscattered electrons for each detection area at the same time. Details of the construction and calibration procedures, possible errors, and sources of systematic deviations as well as first test results are discussed. |
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Keywords: | double differential angular and energy distribution backscattered electrons electron probe microanalysis depth distribution function phiroz |
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