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High cycle fatigue behaviour and generalized fatigue model development of lead-free solder alloy based on local stress approach
Affiliation:1. Innovation Centre for Advanced Electronics, Continental Automotive GmbH, 93055 Regensburg, Germany;2. Faculty of Mechanical Engineering, Technische Hochschule Ingolstadt, 85019, Germany;3. Faculty of Electrical Engineering and Computer Science, Technische Universität Berlin, 10623, Germany;1. School of Chemical Engineering and Technology, Tianjin University, Tianjin 300072, PR China;2. School of Mechanical Engineering, Tianjin University of Technology, Tianjin 300191, PR China;1. Department of Electronics Engineering, Shanghai Key Laboratory of Multidimensional Information Processing, East China Normal University, Shanghai, China;2. Shanghai Integrated Circuit Research & Development Center, Shanghai, China;1. Department of Electrical Engineering, École de technologie supérieure, Montreal, QC, H3C 1K3, Canada;2. Univ. Grenoble Alpes, TIMA, F-38031 Grenoble, France
Abstract:This paper gives an insight into high cycle fatigue (HCF) behaviour of a Pb-free solder alloy in the region between 104 up to 109 fatigue cycles using fatigue specimen. By means of a local stress approach, the method can be translated into solder joint fatigue evaluation in an application. The effect of temperatures (35 °C, 80 °C, 125 °C) on the fatigue property of Pb-free solder alloy is considered in this work to understand the possible fracture mechanisms and micro structural changes in a solder alloy at elevated temperature. Experiments are performed for different interaction factors under mean stresses (R = 0, ? 1, ? 3), stress concentration (notched, un-notched) and surface roughness. SN (stress-life) diagrams presented in this work will compare the fatigue performance of Sn3.8Ag0.7Cu solder alloy for different conditions. Furthermore, mathematical fatigue model based on FKM guideline (in German “Fachkuratorium Maschinenbau) is extracted out of the experiments under all these external effects. The models can be exported later for lifetime evaluation purposes on applications. The paper thereby proposes the use of FKM guideline in the field of microelectronics.
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