Phase imaging with intermodulation atomic force microscopy |
| |
Authors: | Daniel Platz,Erik A. Tholé n,Carsten Hutter,Arndt C. von Bieren,David B. Haviland |
| |
Affiliation: | 1. Nanostructure Physics, Royal Institute of Technology, SE-10691 Stockholm, Sweden;2. Department of Physics, Stockholm University, SE-10691 Stockholm, Sweden |
| |
Abstract: | Intermodulation atomic force microscopy (IMAFM) is a dynamic mode of atomic force microscopy (AFM) with two-tone excitation. The oscillating AFM cantilever in close proximity to a surface experiences the nonlinear tip-sample force which mixes the drive tones and generates new frequency components in the cantilever response known as intermodulation products (IMPs). We present a procedure for extracting the phase at each IMP and demonstrate phase images made by recording this phase while scanning. Amplitude and phase images at intermodulation frequencies exhibit enhanced topographic and material contrast. |
| |
Keywords: | Atomic force microscopy Intermodulation Multifrequency AFM Phase imaging |
本文献已被 ScienceDirect 等数据库收录! |
|