Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics |
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Authors: | Cameron M Kewish Pierre Thibault Martin Dierolf Oliver Bunk Andreas Menzel Joan Vila-Comamala Konstantins Jefimovs Franz Pfeiffer |
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Affiliation: | 1. Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland;2. Technische Universität München, D-85748 Garching, Germany;3. EMPA, CH-8600 Dübendorf, Switzerland |
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Abstract: | A technique for quantitatively characterizing the complex-valued focal wavefield of arbitrary optics is described and applied to reconstructing the coherent focused beam produced by a reflective/diffractive hard X-ray mirror. This phase-retrieval method, based on ptychography, represents an important advance in X-ray optics characterization because the information obtained and potential resolution far exceeds that accessible to methods of directly probing the focus. Ptychography will therefore be well-suited for characterizing and aligning future nanofocusing X-ray optics. |
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Keywords: | X-ray optics Wavefront characterization Ptychography Phase retrieval Diffractive imaging |
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