Real-time atomic force microscopy in lubrication condition |
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Authors: | Hyunsoo Lee Donghyeok Lee K.B. Kim Yongho Seo Hyunsook Kim Haiwon Lee |
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Affiliation: | 1. Faculty of Nanotechnology and Advanced Material Engineering, Sejong University, Seoul 143-747, South Korea;2. Department of Chemistry, Hanyang University, Seoul 133-791, South Korea |
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Abstract: | We have studied frictional force and wear problem in real-time atomic force microscopy in contact-mode using a resonator type mechanical scanner allegedly reported. The fast scanning may cause wear in the sample surface or the tip, and may deteriorate the image quality. Mineral oil was used to make a lubricious surface on a polycarbonate sample, and it was found that the interfacial frictional force was decreased. A Si tip which was coated with a hydrophobic film by means of chemical modification was confirmed to diminish the frictional force in the fast scanning process. The resultant image quality was improved due to reduced friction and wear. |
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Keywords: | AFM Fast scanning Real-time Atomic force microscopy Lubrication condition tip modification |
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