1. Faculty of Microsystem Electronics and Photonics, Wroc?aw University of Technology, Janiszewskiego 11/17, 50-372 Wroc?aw, Poland;2. Physics Institute, ?ód? University of Technology, Wólczańska 219, 90-924 ?ód?, Poland
Abstract:
Characterization of novel nanoelectronic structures and materials requires advanced and high-resolution diagnostic methods. In this article new approach for high sensitivity measurements of electric surface properties using scanning probe microscopy is presented. In this procedure topography and tunneling current flowing between the metallic tip and the surface are observed simultaneously. In our design piezoelectric tuning fork equipped with metallic tip in shear force microscope is used.