|
|||||
|
|
Orientation dependence of electron energy loss spectra and dielectric functions of Ti3SiC2 and Ti3AlC2 |
|
| Authors: | G Hug P Eklund A Orchowski |
| Affiliation: | 1. LEM, ONERA-CNRS, BP 72, F-92322 Châtillon, France;2. Thin Film Physics Division, IFM, Linköping University, SE-581 83 Linköping, Sweden;3. Carl Zeiss NTS GmbH, D-73447 Oberkochen, Germany |
| Abstract: | |
| Keywords: | Anisotropy Electronic structure Nanolaminate Conductivity Drude&ndash Lorentz model EELS MAX-phases |
| 本文献已被 ScienceDirect 等数据库收录！ | |