Reply to comment by Maurice et al. in response to “Bragg’s Law Diffraction Simulations for Electron Backscatter Diffraction Analysis” |
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| Authors: | Josh Kacher Jay BasingerBrent L. Adams David T. Fullwood |
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| Affiliation: | Brigham Young University, 2520B Leeper Dr, Champaign, IL 61822, USA |
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| Abstract: | A reply to Maurice et al.'s comment on "Bragg's Law Diffraction Simulations for Electron Backscatter Diffraction" is presented. A new method for microscope geometry calibration is briefly presented. Also, evidence that simple diffraction simulations can be profitable tools for absolute elastic strain measurements in crystalline materials is reiterated. |
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| Keywords: | Scanning electron microscope EBSD Strain |
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