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Higher-order aberration corrector for an image-forming system in a transmission electron microscope
Authors:H Sawada  T Sasaki  F Hosokawa  S Yuasa  M Terao  M Kawazoe  T Nakamichi  T Kaneyama  Y Kondo  K Kimoto  K Suenaga
Affiliation:1. CREST, Japan Science and Technology Agency, 5 Sanbancho, Chiyoda-ku, Tokyo 102-0075, Japan;2. JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo, Japan;3. National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan;4. Research Center for Advanced Carbon Materials, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8565, Japan
Abstract:We developed a new electron optical system with three dodecapoles to compensate for spherical aberration and six-fold astigmatism, which generally remains in a two-hexapole type corrector. In this study, we applied the corrector for image-forming system in transmission electron microscope. Compensation for higher-order aberration was demonstrated through a diffractogram tableau using a triple three-fold astigmatism field system, which was then compared with a double hexapole field system. Using this electron optical system, six-fold astigmatism was measured to be less than 0.1 mm at an acceleration voltage of 60 kV, showing that the system successfully compensated for six-fold astigmatism.
Keywords:Six-fold astigmatism  Diffractogram tableau  Aberration correction
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