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利用线阵CCD非接触测量材料变形量的方法
引用本文:王庆有,于涓汇,郭青,张盛彬.利用线阵CCD非接触测量材料变形量的方法[J].光电工程,2002,29(4):20-23.
作者姓名:王庆有  于涓汇  郭青  张盛彬
作者单位:天津大学精密仪器与光电子工程学院, 天津,300072;光电信息技术科学教育部重点实验室,天津,300072
摘    要:用线阵CCD作为光电传感器非接触测量材料拉伸过程中的变形量,不但比常规的引伸计测量的方法更客观,而且可以测量材料拉伸变形到断的全过程。该方法能在X和Y两上方向上同时测量材料变形量,可以获得材料在实验的全过程中两上方向的“应力-应变”关系曲线。采用CCD拼接技术,测量精度可达到1μm,测量范围80mm。

关 键 词:CCD  非接触测量  材料变形量  应力测量  材料拉伸实验
文章编号:1003-501X(2002)04-0020-04
收稿时间:2001/10/18
修稿时间:2001年10月18

A method for measuring material deformation with linear CCD detectors
WANG Qing-you,YU Juan-hui,GUO Qing,ZHANG Sheng-bin.A method for measuring material deformation with linear CCD detectors[J].Opto-Electronic Engineering,2002,29(4):20-23.
Authors:WANG Qing-you  YU Juan-hui  GUO Qing  ZHANG Sheng-bin
Abstract:Measurement of the deformation quantity of a material during stretching process by using linear CCD detectors in non-contact mode, not only is more objective than the common extensometer measurement method, but also can measure the whole process from stretching deformation to breaking .The deformation quantity of a material can be simultaneously measured at both direction of X and Y and the stress-strain curves of the both direction during the whole experimental process of a material can be obtained. With CCD splicing technique, the measuring accuracy can be reached 1mm and measuring range 80mm.
Keywords:Non-contact measurement  Liner CCD  Stress measurement  Deformation measurement
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