Estimation of mass thickness response of embedded aggregated silica nanospheres from high angle annular dark‐field scanning transmission electron micrographs |
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| Authors: | M. NORDIN C. ABRAHAMSSON C. HAMNGREN BLOMQVIST H. HÄBEL M. RÖDING E. OLSSON M. NYDÉN M. RUDEMO |
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| Affiliation: | 1. Applied Surface Chemistry, Department of Chemical and Biological Engineering, Chalmers University of Technology, , Gothenburg, Sweden;2. Department of Applied Physics, Chalmers University of Technology, , Gothenburg, Sweden;3. Department of Mathematical Sciences, Chalmers University of Technology and Gothenburg University, , 41296 Gothenburg, Sweden;4. Ian Wark Research Institute, University of South Australia, SA, , Adelaide, Australia |
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| Abstract: | In this study, we investigate the functional behaviour of the intensity in high‐angle annular dark field scanning transmission electron micrograph images. The model material is a silica particle (20 nm) gel at 5 wt%. By assuming that the intensity response is monotonically increasing with increasing mass thickness of silica, an estimate of the functional form is calculated using a maximum likelihood approach. We conclude that a linear functional form of the intensity provides a fair estimate but that a power function is significantly better for estimating the amount of silica in the z‐direction. The work adds to the development of quantifying material properties from electron micrographs, especially in the field of tomography methods and three‐dimensional quantitative structural characterization from a scanning transmission electron micrograph. It also provides means for direct three‐dimensional quantitative structural characterization from a scanning transmission electron micrograph. |
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| Keywords: | Likelihood mass thickness scanning transmission electron microscopy structural characterization |
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