| 混合技术电路板簇测试的多边界扫描链优化配置 |
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| 引用本文： | 刘冠军,温熙森,曾芷德,易晓山. 混合技术电路板簇测试的多边界扫描链优化配置[J]. 计算机辅助设计与图形学学报, 2000, 12(10): 792-795 |
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| 作者姓名： | 刘冠军 温熙森 曾芷德 易晓山 |
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| 作者单位： | 1. 国防科技大学智能监控与故障诊断研究室,长沙,410073
2. 国防科技大学计算机学院,长沙,410073 |
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| 摘 要： | 由边界扫描器件和非边界扫描器件组装的混合技术电路板将在今后相当长时间内广泛存在，析台由非边界扫描器件组成的簇的测试是边界扫描测试领域重要而富有实际价值的问题。为减少其测试时间，基于贪婪策略和单扫描链最优排序技术，提出了一种多边界扫描链优化配置技术，经实例验证表明，该技术可以有效地减少混合技术电路板族测试时间，提高测试效率。
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| 关 键 词： | 边界扫描 簇测试 混合技术电路板 VLSI |
Optimal Configuration of Multiple Boundary Scan Chains for Clusters Testing in Mixed Technology Board |
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| LIU Guan-Jun,WEN Xi-Sen,ZENG Zhi-De,YI Xiao-Shan. Optimal Configuration of Multiple Boundary Scan Chains for Clusters Testing in Mixed Technology Board[J]. Journal of Computer-Aided Design & Computer Graphics, 2000, 12(10): 792-795 |
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| Authors: | LIU Guan-Jun WEN Xi-Sen ZENG Zhi-De YI Xiao-Shan |
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| Abstract: | The MTB composed of both boundary scan chips and non boundary scan devices will be existing for a long time. Clusters Testing of non boundary scan devices in MTB is a very important and practical problem. In order to reduce the test time of clusters in MTB, a technique of optimal configuring multiple boundary scan chains is presented based on the greedy strategy and the sorting technique of single boundary scan chain. The examples show that this technique can increase the test efficiency significantly. |
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| Keywords: | boundary scan clusters testing mixed technology board |
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