| 基于掉电数据存储的耐压绝缘测试系统设计 |
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| 引用本文： | 可晓海,古丽江.库尔班,常莉丽,王平,路翀.基于掉电数据存储的耐压绝缘测试系统设计[J].电子设计工程,2014(3):124-128. |
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| 作者姓名： | 可晓海 古丽江.库尔班 常莉丽 王平 路翀 |
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| 作者单位： | 伊犁师范学院电子与信息工程学院,新疆伊宁835000 |
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| 基金项目： | 新疆自然科学基金资助项目（2009211A10）;伊犁师范学院项目（YLYB201138） |
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| 摘 要： | 应用非易失性存储芯片24C16与单片机相连接,设计了一种基于掉电数据存储的耐压绝缘测试系统,详细说明了掉电数据存储的耐压绝缘测试系统的设计思路和硬件电路结构,编写了相应的读写程序.这种串行非易失性存储技术具有高速读写、百万次擦写寿命和数据保存时间长的优点,能极大提高系统的适用范围和系统的测试效率.
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| 关 键 词： | 耐压绝缘测试 24WC16芯片 掉电数据存储 单片机 |
Design of pressure insulation test system based on power-down data storage |
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| KE Xiao-hai,KUERBAN Gulijiang,CHANG Li-li,WANG Ping,LU Chong.Design of pressure insulation test system based on power-down data storage[J].Electronic Design Engineering,2014(3):124-128. |
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| Authors: | KE Xiao-hai KUERBAN Gulijiang CHANG Li-li WANG Ping LU Chong |
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| Affiliation: | (School of Electronic and Information Engineering YiLi Normal College, Yining 835000, China) |
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| Abstract: | Design a pressure insulation testing system based on power-down data storage which used the nonvolatile memory chips 24c16 power-fail data storage capabilities connected to the microcontroller in this paper.Designing idea and the circuit structure of the Design of pressure insulation test system based on power-down data storage was described in detail,and the write and read programs were complied.Because of this serial nonvolatile storage technology has much merits,such as high speed read and write,million times to wipe and storage for long time.These advantages can greatly enhance the application scope of system and the test efficiency of system. |
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| Keywords: | pressure insulation test 24WC16 chips power-down data storage microcontroller |
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