| Abstract: | In this paper, CMOS‐based low‐noise amplifiers with JFET‐CMOS technology for high‐resolution sensor interface circuits are presented. A differential difference amplifier (DDA) configuration is employed to realize differential signal amplification with very high input impedance, which is required for the front‐end circuit in many sensor applications. Low‐noise JFET devices are used as input pair of the input differential stages or source‐grounded output load devices, which are dominant in the total noise floor of DDA circuits. A fully differential amplifier circuit with pure CMOS DDA and three types of JFET‐CMOS DDAs were fabricated and their noise performances were compared. The results show that the total noise floor of the JFET‐CMOS amplifier was much lower compared to that of the pure CMOS configuration. The noise‐reduction effect of JFET replacement depends on the circuit configuration. The noise reduction effect by JFET device was maximum of about ? 18 dB at 2.5 Hz. JFET‐CMOS technology is very effective in improving the signal‐to‐noise ratio (SNR) of a sensor interface circuit with CMOS‐based sensing systems. © 2008 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc. |
