High speed sub-micron bit detection using tapered aperture mounted optical slider flying above a patterned metal medium

Rapid advances in the development of the digital network society have necessitated both large capacity and higher data transfer rate for every type of digital storage equipment. Proximity optical recording based on the near-field interaction principle promises to provide breakthroughs in overcoming rigid optical diffraction limits and wave length shortening limits. We have previously presented a compact optical head assembly consisting of a combination of a pyramidal hole processed silicon slider and light-wave guide combined suspension. Attaining higher recording density requires both a much smaller sized aperture and a highly efficient laser power delivery mechanism. To satisfy these requirements, we have introduced a planar lens and tapered aperture processed optical slider, delivering laser power through a single mode optical fiber, and we have demonstrated sub-micron size (150–200 nm-long) bit signals at more than a 10 MHz frequency band.The authors would like to thank Mr. Tamotsu Kusumi and Tadashi Sasagawa, Nikon Corp. for their processing of fine 350 nm line and space patterns on thin chromium films using short wavelength light lithography. The authors would like to thank Dr. Hisataka Takenaka and Dr. Hisashi Ito, NTT Advance Tecnology Corp., for forming a high quality carbon protective overcoat on the patterned media. The authors also would like to thank Dr. Takanori Doi, Toda Corp., for his helpful suggestions and careful treatment in forming the lubricant layer on the patterned metal media. The authors would also like to thank Mr. Masanori Sahara and Mr. Takashi Suzuki for their useful advice in applying the APD in our readout system.