| CMOS电路电流测试综述 |
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| 引用本文： | 闵应骅. CMOS电路电流测试综述[J]. 计算机研究与发展, 1999, 36(2): 129-133 |
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| 作者姓名： | 闵应骅 |
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| 作者单位： | 中国科学院计算技术研究所 |
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| 摘 要： | 集成电路设计与测试是当今计算机技术研究的主要问题之一。ＣＭＯＳ电路的静态电流（ＩＤＤＱ）测试方法自８０年代提出以来，已被工业界采用，作为高可靠芯片的测试手段。近年来，动态电流（ＩＤＤＴ）测试方法正在研究中。现在正面临一些亟待解决的问题，希望闫家的参与。文中对ＣＭＯＳ电路电流测试方法作一综述。
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| 关 键 词： | CMOS电路 电流测试 集成电路 计算机 |
A SURVEY OF CURRENT TESTING FOR CMOS CIRCUITS |
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| MIN Ying-Hua. A SURVEY OF CURRENT TESTING FOR CMOS CIRCUITS[J]. Journal of Computer Research and Development, 1999, 36(2): 129-133 |
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| Authors: | MIN Ying-Hua |
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| Affiliation: | MIN Ying-Hua;( |
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| Abstract: | IC design and test is one of the major research areas in computer technology today. I DDQ (quiescent power supply current) testing has become a worldwide accepted test method for detecting CMOS IC defects since its first publication in early 1980's. Recently, I DDT (dynamic power supply current) testing is under investigation with many open problems. A survey of current testing techniques for CMOS circuits is provided in the paper. |
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| Keywords: | CMOS circuits current testing I DDQ I DDT |
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