| 基于VXI总线技术的自动测试系统的研制 |
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| 引用本文： | 李树盛. 基于VXI总线技术的自动测试系统的研制[J]. 测试技术学报, 2005, 19(4): 459-463 |
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| 作者姓名： | 李树盛 |
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| 作者单位： | 中北大学,电子科学与技术系,山西,太原,030051 |
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| 摘 要： | 叙述了用于满足导弹研制测试需求的基于VXI总线技术开发的先进的自动测试系统，分析了某飞航导弹自动测试系统的功能需求，在此基础上给出测试系统的工作原理．并且详细介绍了测试系统中需要自行研发的RS-422串行通信模块设计，包括串行通信模块总体框图和功能电路设计方案．介绍了32路扫描A／D模块设计及触发模块设计和扫描时序发生器设计．
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| 关 键 词： | 自动测试系统 VXI总线 串行通信模块 扫描A/D模块 触发模块 时序发生器 |
| 文章编号： | 1671-7449（2005）04-0459-05 |
| 收稿时间： | 2004-10-13 |
| 修稿时间： | 2004-10-13 |
Design of Automatic Test System Based on VXI Bus Technology |
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| LI Shu-sheng. Design of Automatic Test System Based on VXI Bus Technology[J]. Journal of Test and Measurement Techol, 2005, 19(4): 459-463 |
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| Authors: | LI Shu-sheng |
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| Affiliation: | Dept. of Electronic Science and Technology, North University of China, Taiyuan 080051, China |
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| Abstract: | The VXI bus technology is applied to integrate the advanced automatic test system. The function requirement of the test system is analyzed in the thesis. Based on this, the whole scheme of the automatic test system is put forward. Then the design of the RS-422 serial communication module is introduced in detail, including the whole scheme of serial communication module and the design of functional circuit. The 32 channel isolated scan A/D module is also discussed in the thesis, including trigger module and time sequence generator. |
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| Keywords: | automatic test system VXI serial communication module isolated scan A/D module trigger module time sequence generator |
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