The dielectric response of doped semiconducting glasses |
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Authors: | Brian S. Doyle Andrew K. Jonscher |
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Affiliation: | (1) Chelsea Dielectrics Group, Chelsea College, University of London, Pulton Place, SW6 5PR London, UK;(2) Present address: Cii Honeywell Bull, 78340 Les Clayes S/Bois, France |
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Abstract: | Measurements are reported of the dielectric properties of two semiconducting glasses of composition SiO2 · Na2O with admixtures of Sb2O5 and SnO2, covering a wide range of temperatures and a range of six decades of frequency 10–2 to 104 Hz. Both glasses show a gradual evolution of growing low frequency dispersion (LFD) with increasing temperature, with both the real and imaginary components of the complex susceptibility following a power law of the type n–1, with n 1 at the lowest frequencies. There are also clear indications of reversible phase transitions taking place which manifest themselves by changes in the spectral shape of the dielectric response. |
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