Dislocations in Bi0.4Ca0.6MnO3 epitaxial film grown on (110) SrTiO3 substrate |
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| Authors: | YH DingRS Cai YQ Wang YZ ChenJR Sun |
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| Affiliation: | a The Cultivation Base for State Key Laboratory, Qingdao University, No. 308 Ningxia Road, Qingdao, 266071, PR Chinab State Key Laboratory of Magnetism and Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, 100080, PR China |
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| Abstract: | Bi0.4Ca0.6MnO3 (BCMO) film with a thickness of 110 nm was epitaxially grown on a (110) SrTiO3 (STO) substrate using pulsed laser ablation technique. The microstructure of the epitaxial films was investigated by transmission electron microscopy (TEM) and high-resolution transmission electron microscopy (HRTEM) in details. Two different kinds of dislocations, one being perpendicular to the BCMO/STO interface, the other being parallel to the interface, have been commonly observed. The formation mechanism for these dislocations has been discussed. All the dislocations are thought to relieve the local strain in the epitaxial film. |
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| Keywords: | Thin film Epitaxial growth Electron microscopy Defects |
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