Improved Low-Temperature Environmental Degradation of Yttria-Stabilized Tetragonal Zirconia Polycrystals by Surface Encapsulation

An encapsulating layer was deposited on the surface of tetragonal zirconia polycrystals doped with 3 mol% of yttria (3Y-TZP), to prevent low-temperature environmental degradation (aging) of the material. The layer, which was composed of silica and zircon, was formed on the surface by exposing the specimens next to a bed of silicon carbide powder in a flowing hydrogen atmosphere that contained ∼0.1% water vapor at 1450°C. The layer was ∼0.5 µm thick and is expected to be under strong residual compressive stress. This encapsulation process remarkably improved the low-temperature degradation of the material. The strength of the specimens also was improved by this process.