| 电路故障诊断中探针测试点的筛选算法研究 |
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| 引用本文： | 张世德,苏玮,薛立军,刘莹. 电路故障诊断中探针测试点的筛选算法研究[J]. 微计算机信息, 2007, 23(31): 153-155 |
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| 作者姓名： | 张世德 苏玮 薛立军 刘莹 |
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| 作者单位： | 北京联合大学机电学院,100020 |
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| 基金项目： | 北京市教委科技发展计划项目 |
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| 摘 要： | 介绍了基于故障字典的电路故障诊断系统设计及故障定位过程．提出了针对固定型故障的简化探针测试点集合的流域覆盖法的思想，在分析单固定型故障和多固定型故障的基础上给出具体的筛选算法，讨论了单故障诊断与多故障诊断的应用。
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| 关 键 词： | 探针测试点 筛选算法 单固定型故障 多固定型故障 |
| 文章编号： | 1008-0570（2007）11-1-0153-03 |
| 修稿时间： | 2006-05-03 |
Research of the Algorithem to Pick out the Probe-test-node in the Circuit-fault-diagnosis System |
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| ZHANG SHIDE,SU WEI,XUE LIJUN,LIU YING. Research of the Algorithem to Pick out the Probe-test-node in the Circuit-fault-diagnosis System[J]. Control & Automation, 2007, 23(31): 153-155 |
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| Authors: | ZHANG SHIDE SU WEI XUE LIJUN LIU YING |
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| Abstract: | This paper introduces the fault location procedure and the design of circuit fault diagnosis system based on fault dictionary, it brings forward the thought to simplify the probe-test-node set and gives the specific algorithm for single fixed fault and multiple fixed faults. The application of single fixed fault and multiple fixed faults is also dicussed. |
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| Keywords: | Probe test node Sift algorithm Single fixed fault Multiple fixed faults |
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