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光栅衍射缝间干涉因子次极大强度对称性的菲涅耳半波带法证明
引用本文:谢甫珍,文光俊,谢康,杨华军.光栅衍射缝间干涉因子次极大强度对称性的菲涅耳半波带法证明[J].四川激光,2006,27(1):36-38.
作者姓名:谢甫珍  文光俊  谢康  杨华军
作者单位:电子科技大学光电信息学院;电子科技大学通信工程学院;电子科技大学物理电子学院,成都,610054
摘    要:本文用菲涅耳半波带法推导出了一个非常有用的次极大位置公式,将该位置公式和振幅矢量法求出的次极大位置结合起来,方便地求出了缝间干涉因子的次极大的强度,证明了缝向干涉因子的次极大强度具有对称性。避免了对振幅矢量法求次极大位置这个方程的直接求解,因为用该方法求出的次极大强度与理论值完全符合,说明菲涅耳半波带法不但可以用来分析单缝衍射,同时还完全能够用来分析光栅衍射。

关 键 词:菲涅耳半波带法  次极大强度  缝间干涉因子  光栅衍射  振幅矢量法
文章编号:0253-2743(2006)01-0036-03
收稿时间:2004-04-05
修稿时间:2004年4月5日

Testifying secondary maximum among slits interference item of grating diffraction is symmetrical with Fresnel Zone Plate Method
XIE Fu-zhen,WEN Guang-jun,XIE Kang,YANG Hua-jun.Testifying secondary maximum among slits interference item of grating diffraction is symmetrical with Fresnel Zone Plate Method[J].Laser Journal,2006,27(1):36-38.
Authors:XIE Fu-zhen  WEN Guang-jun  XIE Kang  YANG Hua-jun
Affiliation:1.School of Opti-electronic Information, University of electronic Science and Technology; 2. School of Communication and Information Engineering, UESTE^2; 3.School of Physical Electronics, UESTC^3, Chengdu 610054, China
Abstract:We devise a useful formula of secondary maximum location with Fresnel Zone Plate Method. We combine this Location and that location from amplitude vector method. We find it easily and testify secondary maximum of interference factor is symmetrical. We use this method avoiding find directly the solution of complex equation of secondary maximum location with amplitude vector method. Because calculating result is as symmetrical as theory value. It show that we can analyse not only single-slit diffraction but also grating diffraction with Fresenl Zone Plate Method.
Keywords:Fresnel Zone Plate Method  secondary maximum  interference factor amon slits  grating diffraction  Amplitude Vector method
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