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基于Talbot干涉的X射线光栅成像技术研究进展
引用本文:韩跃平,陈志强,张丽,黄志峰,张冉,姜晓磊.基于Talbot干涉的X射线光栅成像技术研究进展[J].激光与光电子学进展,2012(7):13-20.
作者姓名:韩跃平  陈志强  张丽  黄志峰  张冉  姜晓磊
作者单位:清华大学工程物理系;清华大学粒子技术与辐射成像教育部重点实验室;中北大学信息与通信工程学院
基金项目:国家自然科学基金(61171178);中国博士后科学基金(20110490366);山西省高等学校优秀青年学术带头人支持计划资助课题
摘    要:从技术特点和研究热点的角度,综述了X射线光栅干涉成像技术与系统的国内外最新进展。介绍了具有代表性的基于Talbot-Lau干涉法的X射线光栅成像原理与系统结构,以及物质对X射线的衰减、折射与小角散射的多信息获取技术。综述了国内外对X射线光栅成像技术与系统的优化改进研究,主要包括光栅步进对高位置分辨率的松弛与大视场高分辨率光栅成像技术的实现。介绍了二维光栅与基于光栅的具有时间分辨率的四维成像技术的国内外最新发展动态。展望了X射线光栅成像技术的发展趋势。

关 键 词:X射线光学  光栅成像  Talbot-Lau干涉

Developments of X-Ray Grating Imaging Based on Talbot Interferometry
Han Yueping,Chen Zhiqiang,Zhang Li,Huang Zhifeng,Zhang Ran,Jiang Xiaolei.Developments of X-Ray Grating Imaging Based on Talbot Interferometry[J].Laser & Optoelectronics Progress,2012(7):13-20.
Authors:Han Yueping  Chen Zhiqiang  Zhang Li  Huang Zhifeng  Zhang Ran  Jiang Xiaolei
Affiliation:1,2 1Department of Engineering Physics,Tsinghua University,Beijing 100084,China 2Key Laboratory of Particle and Radiation Imaging(Tsinghua University),Ministry of Education,Beijing 100084,China 3School of Information and Communication Engineering,North University of China,Taiyuan,Shanxi 030051,China
Abstract:We present a review of X-ray grating-based imaging based on interferometry,including the recent developments in instrumentation and methodology.The classic X-ray grating-based imaging based on Talbot-Lau interferometry is introduced in terms of its general principles and system configuration,as well as the multiple information(i.e.,attenuation,refraction and small-angle scattering information) retrieval algorithms.Up-to-date analyses and optimizations of this method are presented,including approaches to relax the high positioning resolution requirement in phase stepping process and attempts on large-field-of-view imaging with high-resolution gratings.Secondly,we introduce the latest developments in two-dimensional grating-based imaging and time-resolved four-dimensional grating-based imaging.An outlook of X-ray grating-based imaging is given.
Keywords:X-ray optics  grating imaging  Talbot-Lau interferometry
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