Energy based model to assess interfacial adhesion using a scratch test |
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Authors: | Vincent Le Houérou Christian Gauthier Robert Schirrer |
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Affiliation: | (1) Institut Charles Sadron (I.C.S.), CNRS UPR 022, 23 rue du Loess, BP 84047, 67034 Strasbourg cedex 2, France |
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Abstract: | A common way to improve the scratch resistance of a sensitive surface is to coat it with a thin film. However, the substrate/thin
film adhesion must be well controlled and measurable. The contribution of the present work is to propose a global energy balance
model of the blistering process for the scratching of a substrate/thin film system, which permits one to determine the adhesion
of the system. The adhesion can be measured by following the delaminated area as a function of the scratching distance during
blistering. The particular case of an experimental stable blistering process was studied and the corresponding substrate/thin
film adhesion was derived using the global energy balance model. |
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Keywords: | |
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