| 一种提高测试序列质量的方法 |
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| 引用本文： | 刘煜坤,张礼勇,张旭.一种提高测试序列质量的方法[J].哈尔滨理工大学学报,2009,14(2):86-89. |
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| 作者姓名： | 刘煜坤 张礼勇 张旭 |
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| 作者单位： | 哈尔滨理工大学,测控技术及通信工程学院,黑龙江,哈尔滨,150040 |
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| 基金项目： | 国家重点实验室资助项目 |
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| 摘 要： | 针对电路测试序列质量低而导致测试费用高的问题，提出了修改扫描选择子序列提高测试序列质量的方法．通过组合测试集转化生成测试序列，研究分析组合测试集与转化测试序列的质量．通过修改测试序列的扫描选择子序列，使其能在相同的测试时间内检测更多故障，减少测试所需时间，降低测试费用．基准电路实验结果表明，应用本文方法测试序列质量明显提高，相同故障覆盖率下，所需测试时间仅为典型方法的50％．
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| 关 键 词： | 集成电路 测试序列 测试质量 故障仿真 |
A New Approach to Improve the Quality of Test Sequence |
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| LIU Yu-kun,ZHANG Li-yong,ZHANG Xu.A New Approach to Improve the Quality of Test Sequence[J].Journal of Harbin University of Science and Technology,2009,14(2):86-89. |
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| Authors: | LIU Yu-kun ZHANG Li-yong ZHANG Xu |
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| Affiliation: | School of Measure-control Technology and Communication Engineering;Harbin University of Sicence and Technology;Harbin 150040;China |
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| Abstract: | According to the problem of the significant increasing testing cost of VLSI caused by the low test quality,this paper proposes a novel approach to improve the test sequence quality for scan circuits.Combination test set is transferred into the test sequence and the result sequence can detect more faults under same time cycle.The quality of test is researched at the same time,and a new approach is proposed to improve the test sequence quality by modify the scan select sub-sequence.Experiment result of benchm... |
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| Keywords: | integrated circuit test sequence test quality fault simulation |
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