| 线阵CCD光谱分辨率检测系统设计 |
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| 引用本文： | 毕继耀,张大伟,杨海马,黄元申,王光斌,苏仰庆. 线阵CCD光谱分辨率检测系统设计[J]. 电子测量与仪器学报, 2015, 29(7): 1086-1093 |
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| 作者姓名： | 毕继耀 张大伟 杨海马 黄元申 王光斌 苏仰庆 |
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| 作者单位： | 上海理工大学光电信息与计算机工程学院上海200093,1.上海理工大学光电信息与计算机工程学院上海200093；3.上海理工大学上海市现代光学重点实验室上海200093,1.上海理工大学光电信息与计算机工程学院上海200093；2.中国科学院上海技术物理研究所上海200083,1.上海理工大学光电信息与计算机工程学院上海200093；3.上海理工大学上海市现代光学重点实验室上海200093,上海理工大学光电信息与计算机工程学院上海200093,上海理工大学光电信息与计算机工程学院上海200093 |
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| 基金项目： | 国家自然科学基金青年基金（61302181）、上海市自然科学基金（14ZR1418400）、上海市教委科研创新（13YZ111）、上海市闵行区产学研（3714302006）项目 |
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| 摘 要： | 在分析光谱测试仪器检测设备发展现状的前提下,为解决光栅分辨率测试仪器中存在的电路复杂、探测器灵敏度低、结构可变通性差等问题,设计了一种以线阵CCD ILX554B为探测器的、以STM32F103为主控单元的线阵CCD光谱分辨率检测系统。系统利用片上高速时钟产生线阵CCD所需的驱动时序,经片上ADC采样后获取实时的光谱数据,将采集的数据经USB接口上传给上位机进行处理,获得最终的被测分光器件的光谱分辨率信息。最后,分别以汞灯和氩灯为光源,利用所设计的系统对光栅分辨率进行了测试,实验数据表明,在500 k Hz的驱动频率下,系统光谱分辨率可以达到0.01nm。系统满足低成本、高精度、稳定和可靠等要求。
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| 关 键 词： | 光谱分辨率；STM32F103；线阵CCD；光栅 |
Design of linear CCD spectral resolution detection system |
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| Bi Jiyao,Zhang Dawei,Yang Haim,Huang Yuanshen,Wang Guangbin and SuYangqing. Design of linear CCD spectral resolution detection system[J]. Journal of Electronic Measurement and Instrument, 2015, 29(7): 1086-1093 |
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| Authors: | Bi Jiyao Zhang Dawei Yang Haim Huang Yuanshen Wang Guangbin SuYangqing |
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| Affiliation: | School of Optical Electrical and computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China,1.School of Optical Electrical and computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China; 3.Shanghai Key Laboratory of Modern Optical System, University of Shanghai for Science and Technology, Shanghai 200093, China,1.School of Optical Electrical and computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China;2.Shanghai Institute of Technical Physics of Chinese Academy of Sciences, Shanghai 200083, China,1.School of Optical Electrical and computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China; 3.Shanghai Key Laboratory of Modern Optical System, University of Shanghai for Science and Technology, Shanghai 200093, China,School of Optical Electrical and computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China and School of Optical Electrical and computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China |
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| Abstract: | Based on the analysis of the current development situation of detection equipment spectrum testing instrument, in order to solve some problems in the spectral resolution test instrument, such as the complex circuit, low sensitivity, complex detector structure which can limit the flexibility, so the paper designs a linear CCD spectral resolution detection system by putting the linear CCD ILX554B as detector, using STM32F103 as the main control chip. The timing and integration time are designed with timer on the chip. The on chip ADC sample spectral data in the real time and the data will be collected through the USB interface to the host computer for processing and displaying some information we need. Finally, the measuring system of spectral resolution tests the spectra of a Hg lamp whose light is through the spectral plane grating. The experimental data show that, in the driving frequency of 500 kHz, the spectral resolution can reach 0.01 nm. The design is low cost, high accuracy and meets the need of the detection system completely. |
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| Keywords: | spectral resolution STM32F103 linear CCD grating |
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