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平衡式干涉仪的光学系统设计
引用本文:任冬梅,K M Lawton,J A Miller,朱振宇,万宇.平衡式干涉仪的光学系统设计[J].计量学报,2009,30(Z1).
作者姓名:任冬梅  K M Lawton  J A Miller  朱振宇  万宇
作者单位:1. 北京长城计量测试技术研究所,北京,100095
2. University of North Carolina at Charlotte,Charlotte,NC 28213,USA
摘    要:介绍了两种平衡式干涉仪的光学系统设计方法,分别给出了用于单端测量和双端测量的具体设计方案.由于采用的平衡式光学系统中测量光束和参考光束具有近似相等的光程长度和相似的路径,其光程差仅由被测件的长度或被测表面与测量参考镜之间的距离而引起,因此干涉仪具有很高的稳定性.用双端测量双光程平衡式干涉仪对准零长度试样进行测量,在185 h测量中所得数据的标准偏差为2.1 nm.

关 键 词:计量学  干涉仪  平衡式光学系统设计  微位移测量

The Design of the Optical System in the Balanced Interferometers
REN Dong-mei,K M Lawton,J A Miller,ZHU Zhen-yu,WAN Yu.The Design of the Optical System in the Balanced Interferometers[J].Acta Metrologica Sinica,2009,30(Z1).
Authors:REN Dong-mei  K M Lawton  J A Miller  ZHU Zhen-yu  WAN Yu
Abstract:Two methods to design optical systems for the balanced interferometers are introduced. Optical systems for both single-sided measurement and double-ended measurement with each type of balanced interferometers are presented. Since the interferometers have balanced optical systems , in which the measurement beam and the reference beam have similar paths and equal optical path lengths except for the path difference caused by the sample length or the distance between the measurement and reference surfaces, and they have high stability. Measurement of a quasi-zero-length sample using a double-pass balanced interferometer by double-ended measurement showed that the standard deviation of measurement in 185 h is 2. 1 nm.
Keywords:Metrology  Interferometer  Balanced optical system design  Measurement of micro - displacement
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