| 用中子活化分析镀膜厚度及其探测极限研究 |
| |
| 引用本文： | 姚茂莹,徐家云,高党忠,张地大,杨尊勇,姚振强,王明秋.用中子活化分析镀膜厚度及其探测极限研究[J].原子能科学技术,2010,44(12):1509-1512. |
| |
| 作者姓名： | 姚茂莹 徐家云 高党忠 张地大 杨尊勇 姚振强 王明秋 |
| |
| 作者单位： | 1.四川大学 ;物理科学与技术学院，四川 ;成都610064）;2.中国工程物理研究院 ;激光聚变研究中心，四川 ;绵阳621900 |
| |
| 基金项目： | 国家自然科学基金-中国工程物理研究院联合基金资助项目 |
| |
| 摘 要： | 本工作提出用中子活化分析有基底的单层或多层镀膜厚度的方法。用Am-Be中子源对Au、Al、Cu等薄膜活化后,用HPGe探测器测量被活化薄膜放出的特征γ射线全能峰面积,并用蒙特卡罗方法模拟计算HPGe探测器对不同特征γ射线的探测效率,得到用反应堆中子源活化分析不同元素镀膜厚度的方法和探测极限。与目前广泛使用的X射线荧光方法相比,其分析灵敏度可提高几个量级。
|
| 关 键 词： | 镀膜厚度 中子活化 测量灵敏度 |
Investigation on Feasibility and Detection Limits for Determination of Coating Film Thickness by Neutron Activation Analysis |
| |
| YAO Mao-ying,XU Jia-yun,GAO Dang-zhong,ZHANG Di-da,YANG Zun-yong,YAO Zhen-qiang,WANG Ming-qiu.Investigation on Feasibility and Detection Limits for Determination of Coating Film Thickness by Neutron Activation Analysis[J].Atomic Energy Science and Technology,2010,44(12):1509-1512. |
| |
| Authors: | YAO Mao-ying XU Jia-yun GAO Dang-zhong ZHANG Di-da YANG Zun-yong YAO Zhen-qiang WANG Ming-qiu |
| |
| Affiliation: | 1.School of Physics Science and Technology, Sichuan University, Chengdu 610064, China;2.Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China |
| |
| Abstract: | A method for the determination of coating film thickness by neutron activation was proposed in this paper. After Au, Al and Cu et al. films were activated with a Am-Be neutron source, the characteristic γ-rays emitted by the activated nuclides in the films were counted with a HPGe γ spectrometer. The detection limits of film thickness by ray counts and the Monte-Carlo simulated detection efficiencies. The possible detection limits are typically 4-5 orders of magnitude better than those by fluorescent X-ray method, which is currently widely used to determine coating film thickness. |
| |
| Keywords: | coating film thickness neutron activation measuring sensitivity |
| 本文献已被 CNKI 万方数据 等数据库收录！ |
| 点击此处可从《原子能科学技术》浏览原始摘要信息 |
|
点击此处可从《原子能科学技术》下载全文 |
|
