Comparison of elastic interaction of a dislocation and a crack for four bonding conditions of the crack plane

A comparison of elastic interaction of a dislocation and a crack for four bonding conditions of the crack plane was made. Four cases of single crystalline material, sliding grain boundary, perfectly bonded interface, and sliding interface were considered. The stress intensity factors arising from edge and screw dislocations and their image forces for the above four cases were compared. The stress intensity factor at a crack tip along the perfectly bonded interface arising from screw dislocation can be obtained from that in a single crystalline material if the shear modulus in the single crystalline material is replaced by the harmonic mean of both shear moduli in the bimaterial. The stress intensity factor at a crack tip along the sliding interface arising from edge dislocation in the bimaterial can be obtained from that along the sliding grain boundary in the single material if the μ/(1−ν) in the single material is substituted by the harmonic mean of μ/(1− ν) in the bimaterial where μ and ν are the shear modulus and Poisson's ratio, respectively. The solutions of screw dislocation near a crack along the sliding grain boundary and sliding interface are the same as that of screw dislocation and its mirror image. Generally, the effect of edge dislocation for perfectly bonded interface on the crack propagation is more pronounced than that for the sliding interface. The effect of edge dislocation on the crack propagation is mixed mode for the cases of perfectly bonded interface and single crystalline material, but mode I fracture for the cases of sliding interface and sliding grain boundary. All curves of Fx versus distance r from the dislocation at interface to the right-hand crack tip are similar to one another regardless of dislocation source for both sliding interface and perfectly bonded interface. The level of Fx for m=0 is larger than that for m=−1. This revised version was published online in August 2006 with corrections to the Cover Date.