A mura detection method |
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Authors: | Kazutaka Taniguchi [Author Vitae] Kunio Ueta [Author Vitae] [Author Vitae] |
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Affiliation: | a Dainippon Screen Mfg. Co., Ltd. Kyoto, Japan b Department of Information and Communication Engineering, Osaka City University, Osaka, Japan |
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Abstract: | A method to detect mura, which is defined as an irregular lightness variation on a uniformly manufactured surface, is necessary to maintain the quality of the display devices. The mura is understood as defects without a clear contour or a contrast which imparts an unpleasant sensation to viewers. We propose a method to detect mura of the display devices’ components that have lower intensity than the final device with some background pattern considering the property of the human vision system. |
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Keywords: | Mura Defect Detection Vision Spatial frequency Contrast enhancement |
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