Specific features of the technology for testing parts via the ЛЮM33-OB penetrant luminescent method

A new kit for luminescent testing via the ЛЮM33-OB method contains materials in which shortcomings inherent to testing with the ЛЮM1-OB method are removed or diminished. A standard technology for testing parts that uses new materials is described. The structure of and operations required by the new technology possess similarities to those of the technology based on the ЛЮM1-OB method but still have some specific features.