Determination of bulk etch rate for CR-39 nuclear track detectors using an X-ray fluorescence method

The thickness of a CR-39 detector is determined using an energy dispersive X-ray fluorescence (EDXRF) method of analysis. The method is based on exciting a suitable target and measuring the intensity of its fluorescence X-ray lines passing through the CR-39 sample in a fixed geometry. By properly selecting the target material, the method succeeds in assessing the thickness change of CR-39 detectors etched for different time intervals. The bulk etch rate (V_b) may thus be obtained, which is an important parameter for any solid state nuclear track detector. Application of the EDXRF method yielded a value of V_b = (2.01 ± 0.04) μm h⁻¹ for etching in a 6 N NaOH solution at 75 °C. This value agrees with the bulk etch rate of (1.90 ± 0.03) μm h⁻¹, obtained by the conventional mass-change method.