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SnS薄膜的制备及其特性研究
引用本文:郑春蕊,雷天民,胡永红,李红生,刘守智. SnS薄膜的制备及其特性研究[J]. 微纳电子技术, 2005, 42(2): 66-68
作者姓名:郑春蕊  雷天民  胡永红  李红生  刘守智
作者单位:1. 西安理工大学电子工程系,西安,710048
2. 西安理工大学材料工程系,西安,710048
基金项目:陕西省教委自然科学基金资助项目(01JK196)、(04JK246)
摘    要:以硫代乙酰胺、三乙醇胺、氯化亚锡和氨水作反应物,氯化铵作缓冲剂,采用化学浴法在玻璃衬底上沉积SnS薄膜。用XRD,SEM等手段分别对薄膜样品的晶体结构及表面形貌进行了表征。XRD分析结果表明薄膜样品为具有斜方晶体结构的多晶SnS薄膜,SEM测量结果显示薄膜晶粒尺寸为数十纳米。此外,本文还简要分析了氯化铵在反应中的作用。

关 键 词:硫化锡  薄膜  化学浴  氯化铵  表征
文章编号:1671-4776(2005)02-0066-03
修稿时间:2004-08-25

Preparation and Characterization of SnS Thin Films
ZHENG Chun-rui a,LEI Tian-mina,HU Yong-hong a,LI Hong-sheng a,LIU Shou-zhi b. Preparation and Characterization of SnS Thin Films[J]. Micronanoelectronic Technology, 2005, 42(2): 66-68
Authors:ZHENG Chun-rui a  LEI Tian-mina  HU Yong-hong a  LI Hong-sheng a  LIU Shou-zhi b
Abstract:SnS thin films were deposited on glass by the chemical bath deposition method using triethanolamine(TEA),thioacetamide,SnCl2·H2O,ammonia(aqeous)as reactant and using NH4Cl(aqeous)as buffer aqeous. XRD and SEM were employed to study the structure and surface of the film samples. XRD results imply that the prepared film is polycrystalline films with orthorhombic structure. SEM results indicate that the crystal size of thin films is about 10~50 nm. In addition,the influence of the NH4Cl on the chemical reaction was discussed briefly.
Keywords:SnS  thin films  chemical bath  NH4Cl  characterization
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