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Improving the testability of switched-capacitor filters
Authors:J L Huertas  A Rueda  D Vázquez
Affiliation:(1) Dto. Diseño Analógico, Centro Nacional de Microelectrónica, Universidad de Sevilla, C/Tarfia, Edificio CICA, 41012 Sevilla, Spain
Abstract:A design-for-test methodology for SC filters is presented, based on an architecture using some additional circuitry and providing extra capabilities for both off-and on-line tests. The approach uses a comparison (voting) mechanism to indicate whether or not two copies of a filter element (a biquad, for instance) have a similar response during their actual operation. The design and implementation of a few filter examples are included to assess the potential usefulness of this new approach.
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